Thin Film Characterization Techniques

Woollam M2000 Spectroscopic Ellipsometer


The J. A. Woollam M-2000 spectroscopic ellipsometer provides fast and accurate thin film characterization over a wide spectroscopic range.



The ezAFM is an all new Atomic Force Microscope which features excellent performance while being remarkably affordable. It’s ideal for student laboratories, high schools, nanotechnology educations and basic research with its compact, high stability, user-friendly design. You are ready to explore nano world with ezAFM.